61.16.-d Electron, ion, and scanning probe microscopy (for electron Microscopy of crystal defects, see 61.72.F) ( 0 Dok. )

• 61.16.Bg Transmission, reflection and scanning electron microscopy (including EBIC) ( 0 Dok. )
• 61.16.Ch Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc. ( 0 Dok. )
• 61.16.Fk Field emission and field-ion microscopy EPR and NMR methods for defect structures, see 61.72.H ( 0 Dok. )
• 61.16.Ms Scanning Auger microscopy, photoelectron microscopy ( 0 Dok. )